Search Result "Strain metrology"
Introduction to Strain Metrology for Semiconductors
Ebook: Semiconductor Strain Metrology: Principles and Applications
Volume: 1 Year: 2012
Author(s): Terence K.S. Wong
Doi: 10.2174/978160805359911201010004
PART 2: OPTICAL STRAIN METROLOGY
Ebook: Semiconductor Strain Metrology: Principles and Applications
Volume: 1 Year: 2012
Author(s): Terence K.S. Wong
Doi: 10.2174/978160805359911201010027
PART 4: EMERGING STRAIN METROLOGY
Ebook: Semiconductor Strain Metrology: Principles and Applications
Volume: 1 Year: 2012
Author(s): Terence K.S. Wong
Doi: 10.2174/978160805359911201010090
PART 3: ELECTRON BEAM STRAIN METROLOGY
Ebook: Semiconductor Strain Metrology: Principles and Applications
Volume: 1 Year: 2012
Author(s): Terence K.S. Wong
Doi: 10.2174/978160805359911201010059
Strain, Stress and Semiconductor Properties
Ebook: Semiconductor Strain Metrology: Principles and Applications
Volume: 1 Year: 2012
Author(s): Terence K.S. Wong
Doi: 10.2174/978160805359911201010015
Grid Method for Accuracy Study of Micro Parts Manufacturing
Journal: Micro and Nanosystems
Volume: 3 Issue: 3 Year: 2011 Page: 263-269
Author(s): E. Minev, K. Popov, R. Minev, S. Dimov, V. Gagov
Micro-Raman Spectroscopy
Ebook: Semiconductor Strain Metrology: Principles and Applications
Volume: 1 Year: 2012
Author(s): Terence K.S. Wong
Doi: 10.2174/978160805359911201010050
Nano-Beam Diffraction and Convergent Beam Electron Diffraction
Ebook: Semiconductor Strain Metrology: Principles and Applications
Volume: 1 Year: 2012
Author(s): Terence K.S. Wong
Doi: 10.2174/978160805359911201010070
Conclusion and Outlook
Ebook: Semiconductor Strain Metrology: Principles and Applications
Volume: 1 Year: 2012
Author(s): Terence K.S. Wong
Doi: 10.2174/978160805359911201010126
Advanced Ceramics for Piezoelectric Actuators
Ebook: Frontiers in Ceramic Science
Volume: 3 Year: 2020
Author(s): N. Suresh Kumar,R. Padma Suvarna,K. Chandra Babu Naidu,Khalid Mujasam Batoo
Doi: 10.2174/9789811478192120030003