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Focused Ion Beam Methods and its Applications in Secondary Batteries

Ebook: Advanced Characterization Technologies for Secondary Batteries
Volume: 1 Year: 2024
Author(s):
Doi: 10.2174/9789815305425124010005

Electron Beam Melting

Ebook: Advances in Additive Manufacturing Processes
Volume: 1 Year: 2021
Author(s): M. Bhuvanesh Kumar,S. M. Senthil,S. Praveen Kumar
Doi: 10.2174/9789815036336121010010

Scanning Electron Microscopy: Theory and Applications

Ebook: Essential Techniques for Medical and Life Scientists: A Guide to Contemporary Methods and Current Applications- Part II
Volume: 1 Year: 2020
Author(s): Charu Arora,Sumantra Bhattacharya,Sanju Soni,Pathik Maji
Doi: 10.2174/9789811464867120010009

Molecular Beam Epitaxy (MBE)

Ebook: Silicon Based Thin Film Solar Cells
Volume: 1 Year: 2013
Author(s): Lorenzo Morresi
Doi: 10.2174/9781608055180113010008

BPF-Type Reconstruction for Dual Helical Cone-Beam CT

Journal: Current Medical Imaging Reviews
Volume: 7 Issue: 2 Year: 2011 Page: 125-135
Author(s): Li Zeng, Xiaobing Zou

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The Cone Beam O-Arm Imaging System: Radiation Dose, Image Quality, and Clinical Applications

Journal: Recent Patents on Medical Imaging (Discontinued)
Volume: 3 Issue: 2 Year: 2013 Page: 103-110
Author(s): Jie Zhang

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Recent Patents on Rotating Double-Prism Scanning Mechanism

Journal: Recent Patents on Mechanical Engineering
Volume: 8 Issue: 1 Year: 2015 Page: 16-26
Author(s): Anhu Li,Xinjian Gao

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PART 3: ELECTRON BEAM STRAIN METROLOGY

Ebook: Semiconductor Strain Metrology: Principles and Applications
Volume: 1 Year: 2012
Author(s): Terence K.S. Wong
Doi: 10.2174/978160805359911201010059

Research Article

Joining of Individual Silicon Carbide Nanowires Via Proton Beam Irradiation

Journal: Current Nanoscience
Volume: 14 Issue: 5 Year: 2018 Page: 354-359
Author(s): Muhammad Rashid Khan,Muhammad Abdul Rauf Khan,Ishaq Ahmad,Muhammad Abdullah Khan,Tariq Iqbal,Fabian Ifeanyichukwu Ezema,Maaza Malek

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A Review of Recent In Situ Deformation Studies Using Synchrotron X-Ray (Micro) Beams

Journal: Micro and Nanosystems
Volume: 4 Issue: 2 Year: 2012 Page: 97-105
Author(s): Alexander M. Korsunsky,Felix Hofmann,Xu Song,Brian Abbey,Nikolaos Baimpas

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