A Review of Recent In Situ Deformation Studies Using Synchrotron X-Ray (Micro) Beams

Title:A Review of Recent In Situ Deformation Studies Using Synchrotron X-Ray (Micro) Beams

Volume: 4 Issue: 2

Author(s): Alexander M. Korsunsky, Felix Hofmann, Xu Song, Brian Abbey and Nikolaos Baimpas

Affiliation:

Keywords: Synchrotron, X-ray diffraction, micro-beam, dislocation

Abstract: The advent of (sub)microscopic focused X-ray beams at third generation synchrotron sources has opened up possibilities for the characterisation of material structure and mechanical behaviour with unprecedented spatial resolution. Crucially, the non-destructive nature and fast rate of X-ray data collection allow in situ deformation to be studied. In this review, we concentrate on the inelastic deformation response of ductile metallic (poly)crystals. We describe a range of diffraction-based techniques we have developed including monochromatic beam reciprocal space mapping, scanning “pink” beam micro-diffraction compound topography, and white beam Laue micro-diffraction. We compare the results obtained using each of the above techniques, and assess and review the insights that they afford into micro-scale material deformation.

Cite this article as:

Korsunsky Alexander M., Hofmann Felix, Song Xu, Abbey Brian and Baimpas Nikolaos, A Review of Recent In Situ Deformation Studies Using Synchrotron X-Ray (Micro) Beams, Micro and Nanosystems 2012; 4 (2) . https://dx.doi.org/10.2174/1876402911204020097