Search Result "T-MUX."


Review Article

Fast Complete Ternary Addition with Novel 3:1 T-Multiplexer

Journal: Micro and Nanosystems
Volume: 14 Issue: 4 Year: 2022 Page: 304-313
Author(s): Rakesh K. Singh

Design, Reliability Modeling and Evaluation of FTSM

Ebook: Multistage Interconnection Network Design for Engineers
Volume: 1 Year: 2023
Author(s):
Doi: 10.2174/9789815165340123010006

Recent Progress and Patents on Computational Structures and Methods with Memristive Devices

Journal: Recent Patents on Electrical & Electronic Engineering
Volume: 6 Issue: 2 Year: 2013 Page: 101-116
Author(s): Ioannis Vourkas, Georgios Ch. Sirakoulis

Evolution of Gamma-Minus MIN

Ebook: Multistage Interconnection Network Design for Engineers
Volume: 1 Year: 2023
Author(s):
Doi: 10.2174/9789815165340123010005

Research Article

CNFET Based Low Power Full Adder Circuit for VLSI Applications

Journal: Nanoscience & Nanotechnology-Asia
Volume: 10 Issue: 3 Year: 2020 Page: 286-291
Author(s): Inamul Hussain,Saurabh Chaudhury

Research Article

Energy Efficient Configurable Layout of Logic Block in QCA Frame Work for an FPGA

Journal: Micro and Nanosystems
Volume: 13 Issue: 2 Year: 2021 Page: 186-199
Author(s): Arindam Sadhu,Rimpa Dey Sarkar,Kunal Das,Debashis De,Maitreyi Ray Kanjilal

Research Article

An Efficient 4X4 Mesh Structure with a Combination of Two NoC Router Architecture

Journal: International Journal of Sensors, Wireless Communications and Control
Volume: 11 Issue: 2 Year: 2021 Page: 169-180
Author(s): Vivek Tiwari,Kavita Khare,Smita Shandilya

Design and Reliability Evaluation of SEGIN-Minus

Ebook: Multistage Interconnection Network Design for Engineers
Volume: 1 Year: 2023
Author(s):
Doi: 10.2174/9789815165340123010008

Design and Reliability Modeling of FTGM

Ebook: Multistage Interconnection Network Design for Engineers
Volume: 1 Year: 2023
Author(s):
Doi: 10.2174/9789815165340123010007

Evolution of Fault Tolerant SEN MIN

Ebook: Multistage Interconnection Network Design for Engineers
Volume: 1 Year: 2023
Author(s):
Doi: 10.2174/9789815165340123010004

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