Search Result "DIBL."
Analytical Modeling of Threshold Voltage and Drain-Induced-Barrier- Lowering Variations Due to Gate Length Fluctuation in Nanometer MOSFETs
Journal: Recent Advances in Electrical & Electronic Engineering
Volume: 10 Issue: 2 Year: 2017 Page: 128-133
Author(s): Lu Weifeng,Wang Guangyi,Lin Mi,Sun Lingling
Device Structure Modifications in Conventional Tunnel Field Effect Transistor (TFET) for Low-power Applications
Ebook: Nanoelectronics Devices: Design, Materials, and Applications (Part I)
Volume: 1 Year: 2023
Author(s):
Doi: 10.2174/9789815136623123010008
An Analytical Modeling and Performance Analysis of Graded Work Function Gate Recessed Channel SOI-MOSFET
Journal: Nanoscience & Nanotechnology-Asia
Volume: 9 Issue: 4 Year: 2019 Page: 504-511
Author(s): Sikha Mishra,Urmila Bhanja,Guru Prasad Mishra
Performance Analysis of Rectangular Core-Shell Double Gate Junctionless Transistor (RCS-DGJLT)
Ebook: Nanoelectronics Devices: Design, Materials, and Applications (Part I)
Volume: 1 Year: 2023
Author(s):
Doi: 10.2174/9789815136623123010006
Transition from Conventional FETs to Novel FETs, SOI, Double Gate, Triple Gate, and GAA FETS
Ebook: Nanoscale Field Effect Transistors: Emerging Applications
Volume: 1 Year: 2023
Author(s):
Doi: 10.2174/9789815165647123010005
Analytical Modeling of D.C. Parameters of Double Gate Junctionless MOSFET in Near and Subthreshold Regime for RF Circuit Application
Journal: Nanoscience & Nanotechnology-Asia
Volume: 10 Issue: 4 Year: 2020 Page: 457-470
Author(s): Dipanjan Sen,Savio J. Sengupta,Swarnil Roy,Manash Chanda,Subir K. Sarkar
An Analytical Drain Current Model for Dual-material Gate Graded - channel and Dual-oxide Thickness Cylindrical Gate (DMG-GC-DOT) MOSFET
Journal: Nanoscience & Nanotechnology-Asia
Volume: 9 Issue: 2 Year: 2019 Page: 291-297
Author(s): Hind Jaafar,Abdellah Aouaj,Ahmed Bouziane,Benjamin Iñiguez
FinFET Advancements and Challenges: A State-of-the-Art Review
Ebook: Nanoelectronics Devices: Design, Materials, and Applications (Part I)
Volume: 1 Year: 2023
Author(s):
Doi: 10.2174/9789815136623123010011
Effect of Tube Current on Linear Measurement Accuracy of Cone Beam Computed Tomography Images
Journal: Current Medical Imaging
Volume: 14 Issue: 2 Year: 2018 Page: 327-333
Author(s): Elif Sener,Erinc Onem,Ali Mert,B. Guniz Baksi
Comprehensive Study of Low-Power SRAM Design Topologies
Journal: Recent Advances in Electrical & Electronic Engineering
Volume: 17 Issue: 9 Year: 2024 Page: 849-858
Author(s): Shailendra Kumar Tripathi,Sushanta Kumar Mandal