Search Result "eulerian strain"
Strain, Stress and Semiconductor Properties
Ebook: Semiconductor Strain Metrology: Principles and Applications
Volume: 1 Year: 2012
Author(s): Terence K.S. Wong
Doi: 10.2174/978160805359911201010015
Introduction to Strain Metrology for Semiconductors
Ebook: Semiconductor Strain Metrology: Principles and Applications
Volume: 1 Year: 2012
Author(s): Terence K.S. Wong
Doi: 10.2174/978160805359911201010004
Expiratory Droplet Dispersion in a Mechanically Ventilated Enclosure
Ebook: Stochastic Lagrangian Modeling for Large Eddy Simulation of Dispersed Turbulent Two-Phase Flows
Volume: 1 Year: 2011
Author(s): Abdallah Sofiane Berrouk
Doi: 10.2174/978160805296711101010095
Assessment of Cardiac Performance with Magnetic Resonance Imaging
Journal: Current Cardiology Reviews
Volume: 2 Issue: 4 Year: 2006 Page: 271-282
Author(s): Alistair A. Young
Finite Element Simulation of MNT
Ebook: Micro and Nanomachining Technology-Size, Model and Complex Mechanism
Volume: 1 Year: 2014
Author(s): Xuesong Han
Doi: 10.2174/9781608057696114010006
Theoretical Prediction of Thermal Pressure for Geophysical Minerals
Journal: Current Physical Chemistry
Volume: 4 Issue: 2 Year: 2014 Page: 195-201
Author(s): Anjani K. Pandey,Harendra K. Rai
Research Status of 3-D Finite Element Simulation of Metal Cutting
Journal: Recent Patents on Engineering
Volume: 12 Issue: 2 Year: 2018 Page: 103-111
Author(s): Meng Liu,Guohe Li
Pulse Wave Propagation in Large Blood Vessels Based on Fluid- Solid Interactions Methods
Ebook: Single and Two-Phase Flows on Chemical and Biomedical Engineering
Volume: 1 Year: 2012
Author(s): Tomohiro Fukui,Kim H. Parker,Takami Yamaguchi
Doi: 10.2174/978160805295011201010460
Modeling and Simulation Techniques Used in Micro and Nanotechnology and Manufacturing
Journal: Micro and Nanosystems
Volume: 1 Issue: 2 Year: 2009 Page: 105-115
Author(s): D. E. Manolakos, A. P. Markopoulos
Comparison of Liutex and Eigenvalue-based Vortex Identification Criteria for Compressible Flows
Ebook: Current Developments in Mathematical Sciences
Volume: 2 Year: 2020
Author(s): Yisheng Gao,Chaoqun Liu
Doi: 10.2174/9789811437601120020008