Search Result "Dynamic reliability"


Stochastic Finite Element Method of Dynamic Reliability

Ebook: Reliability Calculations with the Stochastic Finite Element
Volume: 1 Year: 2020
Author(s): Wenhui Mo
Doi: 10.2174/9789811485534120010006

Research Article

Assessment of the Impact of Dynamic Line Rating on Reliability Indices of Level I Systems

Journal: Recent Advances in Electrical & Electronic Engineering
Volume: 12 Issue: 4 Year: 2019 Page: 286-297
Author(s): Alvaro A. Zambrano Pinto,Javier Rosero Garcia

Review Article

A Review on Reliability Modeling of Manufacturing Systems Considering the Production Quality and Equipment Reliability

Journal: Recent Patents on Engineering
Volume: 15 Issue: 1 Year: 2021 Page: 22-29
Author(s): Kewu Li,Jun Yang,Shuo Huang

Research Article

Optimization Method of the Equipment Reliability Testing

Journal: Recent Patents on Engineering
Volume: 11 Issue: 3 Year: 2017 Page: 223-226
Author(s): Hongyan Dui,Weng Jingjing

Research Article

Recent Patents on Importance Measures for System Reliability Improvement

Journal: Recent Patents on Engineering
Volume: 11 Issue: 3 Year: 2017 Page: 208-214
Author(s): Hongyan Dui

Multi-Criteria Reliability Analysis Based on Heuristic Approaches by the Ritz Method

Journal: Recent Patents on Mechanical Engineering
Volume: 1 Issue: 2 Year: 2008 Page: 106-115
Author(s): Jhojan E. Rojas, Abdelkhalak El Hami, Domingos A. Rade

Fuzzy Reliability Calculation Based on Stochastic Finite Element

Ebook: Uncertain Analysis in Finite Elements Models
Volume: 1 Year: 2022
Author(s):
Doi: 10.2174/9789815079067122010004

Testing & Reliability Engineering

Ebook: Durable Ideas in Software Engineering: Concepts, Methods and Approaches from My Virtual Toolbox
Volume: 1 Year: 2013
Author(s): James J. Cusick
Doi: 10.2174/9781608054763113010011

Research Article

Two-terminal Reliability Analysis for Time-evolving and Predictable Delay-tolerant Networks

Journal: Recent Advances in Electrical & Electronic Engineering
Volume: 13 Issue: 2 Year: 2020 Page: 236-250
Author(s): Gaurav Khanna,Sanjay K. Chaturvedi,Sieteng Soh

Systematic Review Article

A Systematic Review of Reliability Issues in RF-MEMS Switches

Journal: Micro and Nanosystems
Volume: 11 Issue: 1 Year: 2019 Page: 11-33
Author(s): Muhammad Mubasher Saleem,Hamid Nawaz

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