Search Result "observation reliability"
Optimal Placement of Phasor Measurement Unit based on Bus Observation Reliability
Journal: Recent Advances in Electrical & Electronic Engineering
Volume: 12 Issue: 1 Year: 2019 Page: 68-78
Author(s): Van-Khoi Tran,He-Sheng Zhang
Design, Reliability Modeling and Evaluation of FTSM
Ebook: Multistage Interconnection Network Design for Engineers
Volume: 1 Year: 2023
Author(s):
Doi: 10.2174/9789815165340123010006
Proven Intra and Interobserver Reliability in the Echographic Assessments of Body Fat Changes Related to HIV Associated Adipose Redistribution Syndrome (HARS)
Journal: Current HIV Research
Volume: 6 Issue: 4 Year: 2008 Page: 276-278
Author(s): Rosario Gulizia, Alessia Uglietti, Antonella Grisolia, Cristina Gervasoni, Massimo Galli, Carlo Filice
Observation of Pain in Dementia
Journal: Current Alzheimer Research
Volume: 14 Issue: 5 Year: 2017 Page: 486-500
Author(s): Keela Herr,Sandra Zwakhalen,Kristen Swafford
Testing & Reliability Engineering
Ebook: Durable Ideas in Software Engineering: Concepts, Methods and Approaches from My Virtual Toolbox
Volume: 1 Year: 2013
Author(s): James J. Cusick
Doi: 10.2174/9781608054763113010011
Inter-rater Reliability of Preceptors on Clinical Pharmacy Competency Evaluation
Journal: Current Drug Therapy
Volume: 16 Issue: 2 Year: 2021 Page: 148-153
Author(s): Dixon Thomas,Sherief Khalifa,Jayadevan Sreedharan,Rucha Bond
Assessment of the Impact of Dynamic Line Rating on Reliability Indices of Level I Systems
Journal: Recent Advances in Electrical & Electronic Engineering
Volume: 12 Issue: 4 Year: 2019 Page: 286-297
Author(s): Alvaro A. Zambrano Pinto,Javier Rosero Garcia
A Systematic Review of Reliability Issues in RF-MEMS Switches
Journal: Micro and Nanosystems
Volume: 11 Issue: 1 Year: 2019 Page: 11-33
Author(s): Muhammad Mubasher Saleem,Hamid Nawaz
Reliability Design of Mechanical Systems Subject to Repetitive Stresses
Journal: Recent Patents on Mechanical Engineering
Volume: 8 Issue: 3 Year: 2015 Page: 222-234
Author(s): Seong-Woo Woo,Dennis L. OâNeal
An Overview of Reliability Issues and Challenges Associated with AlGaN/GaN HEMT
Ebook: Nanoelectronic Devices and Applications
Volume: 1 Year: 2024
Author(s): G. Purnachandra Rao,Trupti Ranjan Lenka
Doi: 10.2174/9789815238242124010009