Search Result "film thickness"
Thickness Control and Prediction of Industrial Plastic Film
Journal: Recent Patents on Computer Science
Volume: 9 Issue: 1 Year: 2016 Page: 5-12
Author(s): Cai Li,Tan Yuegang
Qualification of AgPd Thick Films Using Atomic Force Microscopy
Journal: Micro and Nanosystems
Volume: 2 Issue: 3 Year: 2010 Page: 143-148
Author(s): Laszlo Milan Molnar, Szabolcs David, Gabor Harsanyi
A Comprehensive Review of Properties of Screen-Printed Pure and Doped ZnO and CdO Thick Films
Journal: Current Alternative Energy
Volume: 2 Issue: 1 Year: 2018 Page: 42-71
Author(s): Santosh Chackrabarti,Aurangzeb K. Hafiz,Rayees A. Zargar
Ferromagnetic Property and Thickness Effect of Nanocrystalline CrSb Films Deposited on KCl (100) Substrates
Journal: Current Nanoscience
Volume: 5 Issue: 2 Year: 2009 Page: 212-215
Author(s): Shandong Li, Jianglin Fang, Qinghui Chen, Shengguang Cao, Binghuan Hu, Wenqing Zou, Zhigao Huang, Youwei Du
Structural and Mechanical Properties of Ti-N Films â Abinitio Calculations and Experiment
Ebook: Mechanical Engineering Technologies and Applications
Volume: 3 Year: 2023
Author(s):
Doi: 10.2174/9789815179279123030011
Different DC Response in Thickness and Lateral Field Excitation Film Bulk Acoustic Resonators
Journal: Micro and Nanosystems
Volume: 3 Issue: 2 Year: 2011 Page: 111-114
Author(s): Xiaotun Qiu, Hongyu Yu
Overview of Processing Dependences of Microstructure of Ferroelectric Thin Films
Journal: Current Nanoscience
Volume: 5 Issue: 2 Year: 2009 Page: 204-211
Author(s): Haiyan He
Frequency Response of Thin-Film Bulk Acoustic Resonators to the Deposition of Tungsten, Platinum, Aluminium Oxide and Carbon Nanotube Thin-Films
Journal: Micro and Nanosystems
Volume: 4 Issue: 2 Year: 2012 Page: 111-117
Author(s): Martin Nirschl,Daniel Sickert,Ozlem Karaca,Matthias Schreiter,Janos Voros
Effect of Seed Layer Deposition, Au Film Layer Thickness and Crystal Orientation on the Synthesis of Hydrothermally Grown ZnO Nanowires
Journal: Current Nanoscience
Volume: 10 Issue: 6 Year: 2014 Page: 827-836
Author(s): D.P. Neveling,T.S. van den Heever,R. Bucher,W.J. Perold,L.M.T. Dicks
Characterization of Porous Anodic Aluminum Oxide Films by Luminescence Methods - A Review
Journal: Current Nanoscience
Volume: 11 Issue: 5 Year: 2015 Page: 547-559
Author(s): Stevan Stojadinovic,Rastko Vasilic