Search Result "Microscopic forces"

Amyloid Under the Atomic Force Microscope

Journal: Protein & Peptide Letters
Volume: 13 Issue: 3 Year: 2006 Page: 261-270
Author(s): Walraj S. Gosal, Sarah L. Myers, Sheena E. Radford, Neil H. Thomson

Review Article

High-speed Atomic Force Microscope Technology: A Review

Journal: Current Nanoscience
Volume: 18 Issue: 5 Year: 2022 Page: 545-553
Author(s): Ke Xu,Qiang An,Peng Li

Mini-Review Article

Recent Progress in Self-sensing Probe Technology in Atomic Force Microscope

Journal: Current Nanoscience
Volume: 17 Issue: 0 Year: 2021 Page: 1-11
Author(s): Ke Xu,Chenghao Ji,Fanan Wei,Zhushan Zhai

Research on the Stress-relaxation Characteristics of Cancer Cells Based on Atomic Force Microscope

Journal: Current Nanoscience
Volume: 8 Issue: 1 Year: 2012 Page: 47-49
Author(s): Jinghe Wang, Miao Yu, Zhichao Wu, Yingchun Liang, Shen Dong

Principle, Characteristic and Application of Scanning Probe Microscope Series

Journal: Recent Patents on Mechanical Engineering
Volume: 6 Issue: 1 Year: 2013 Page: 48-57
Author(s): Wenchao Tian,Liqin Yang

Review Article

Reflections on the Insertion and Fracture Forces of Microneedles

Journal: Current Drug Delivery
Volume: 14 Issue: 3 Year: 2017 Page: 357-363
Author(s): Kevin Ita

Imaging Conditions Optimization of Human Bronchial Epithelial Cell Based on Atomic Force Microscope

Journal: Current Nanoscience
Volume: 12 Issue: 1 Year: 2016 Page: 118-124
Author(s): Ya Li,Guo Li,Fei Jia,Haidong Liu,Alamusi,Weifeng Yuan

Atomic Force Microscopy and Proteins

Journal: Protein & Peptide Letters
Volume: 9 Issue: 2 Year: 2002 Page: 117-125
Author(s): Luciano Paulino de Silva

Atomic Force Microscopy and its Applications in Secondary Batteries

Ebook: Advanced Characterization Technologies for Secondary Batteries
Volume: 1 Year: 2024
Author(s):
Doi: 10.2174/9789815305425124010006

Electron Microscope: The Tool for Qualitative and Quantitative Analysis of Nano-Materials

Ebook: Recent Advancements in Multidimensional Applications of Nanotechnology
Volume: 1 Year: 2024
Author(s): Lankipalli Krishna Sai,Sunil Kumar Pradhan
Doi: 10.2174/9789815238846124010003

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