Abstract
In this study, a SiGe source-based epitaxial layer-encapsulated TFET (SiGe
source ETLTFET) is developed, and the performance of the device is examined by
optimizing various design parameters, including the epitaxial layer thickness (tepi), gateto-source overlap length (Lov), Ge mole fraction, and source doping concentration. The
average subthreshold swing (SSavg) and ON-OFF current ratio are used to evaluate the
device’s performance. The results show a superior performance of SiGe source
ETLTFET compared with its homojunction counterpart. Furthermore, to demonstrate
the possibilities for using the proposed device in a logic circuit, a resistive load inverter
is designed using the n-type ETLTFET.
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