Abstract
In recent years, Time of Flight-Secondary Ion Mass Spectrometry (TOFSIMS) has been widely employed as a powerful surface characterization tool in secondary battery investigations. In this chapter, we introduced the essential working principle, fundamental functions, and basic components of TOF-SIMS, which hopefully could provide useful insights for potential users and readers with particular interests in TOF-SIMS measurement. Additionally, state-of-the-art practical applications and research progress of TOF-SIMS in secondary batteries, including electrode materials and electrode/electrolyte interfaces, were thoroughly reviewed and discussed.
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Cite this chapter as:
Tinglu Song, Huaqiang Zhu, Ziqi He, Yip Sheung Yuen Wensly, Chuguang Yu, Xinyu Yang, Shunzi Jiang, Fan Xu, Xiaodong Li ;Time-of-flight Secondary Ion Mass Spectrometry and its Applications in Secondary Batteries, Advanced Characterization Technologies for Secondary Batteries (2024) 1: 122. https://doi.org/10.2174/9789815305425124010008
DOI https://doi.org/10.2174/9789815305425124010008 |
Publisher Name Bentham Science Publisher |