Search Result "spectroscopic ellipsometry"
Variable Angle Spectroscopic Ellipsometry
Ebook: Semiconductor Strain Metrology: Principles and Applications
Volume: 1 Year: 2012
Author(s): Terence K.S. Wong
Doi: 10.2174/978160805359911201010028
A Study on Effect of Sol Aging Time on Optical Properties of ZnO Thin Films: Spectroscopic Ellipsometry Method
Journal: Micro and Nanosystems
Volume: 11 Issue: 2 Year: 2019 Page: 100-108
Author(s): Ehsan Motallebi Aghkonbad,Maryam Motallebi Aghgonbad,Hassan Sedghi
Optical Characterization of Al-doped ZnO Films via Sol-gel Method Using Spectroscopic Ellipsometry
Journal: Nanoscience & Nanotechnology-Asia
Volume: 10 Issue: 5 Year: 2020 Page: 642-648
Author(s): Ehsan M. Aghkonbad,Hassan Sedghi,Maryam M. Aghgonbad
Sol-gel Growth of Ni-doped CdS on Glass Substrates: Effect of Spin Coating Speed and Dopant Concentration
Journal: Nanoscience & Nanotechnology-Asia
Volume: 11 Issue: 2 Year: 2021 Page: 230-236
Author(s): Atefeh N. Setayesh,Hassan Sedghi
A Comprehensive Study of the Properties of Sputtered NbOxNy Thin Films
Ebook: Metallic Oxynitride Thin Films by Reactive Sputtering and Related Deposition Methods: Process, Properties and Applications
Volume: 1 Year: 2013
Author(s): Martin Fenker
Doi: 10.2174/9781608051564113010011
Effect of Seed Layer Deposition, Au Film Layer Thickness and Crystal Orientation on the Synthesis of Hydrothermally Grown ZnO Nanowires
Journal: Current Nanoscience
Volume: 10 Issue: 6 Year: 2014 Page: 827-836
Author(s): D.P. Neveling,T.S. van den Heever,R. Bucher,W.J. Perold,L.M.T. Dicks
Chemical-Solution Deposition of Hafnia Films on Self-Assembled Molecular Monolayers
Journal: Current Nanoscience
Volume: 2 Issue: 1 Year: 2006 Page: 13-32
Author(s): Michael Z. Hu, Amy C. DeBaillie, Yayi Wei, Gerold E. Jellison
Gradual Evolution of the Properties in Titanium Oxynitride Thin Films
Ebook: Metallic Oxynitride Thin Films by Reactive Sputtering and Related Deposition Methods: Process, Properties and Applications
Volume: 1 Year: 2013
Author(s): Jean-Marie Chappé,Nicolas Martin
Doi: 10.2174/9781608051564113010009
Index
Ebook: Semiconductor Strain Metrology: Principles and Applications
Volume: 1 Year: 2012
Author(s): Terence K.S. Wong
Doi: 10.2174/978160805359911201010132
Micro-Raman Spectroscopy
Ebook: Semiconductor Strain Metrology: Principles and Applications
Volume: 1 Year: 2012
Author(s): Terence K.S. Wong
Doi: 10.2174/978160805359911201010050