Search Result "ion beam sputtering"
Study of Multi-layered Cobalt Silicide Nanostructured Thin Films Preparedby Ion Beam Sputtering
Journal: Current Nanomaterials
Volume: 7 Issue: 3 Year: 2022 Page: 228-235
Author(s):
Sputtering of Thin Films
Ebook: Silicon Based Thin Film Solar Cells
Volume: 1 Year: 2013
Author(s): Paolo Rava
Doi: 10.2174/9781608055180113010007
Recent Developments in Focused Ion Beam and its Application in Nanotechnology
Journal: Current Nanoscience
Volume: 12 Issue: 6 Year: 2016 Page: 696-711
Author(s): Zongwei Xu, Yongqi Fu, Wei Han, Dongguang Wei, Huisheng Jiao, Haifeng Gao
Growth Mechanism and Field Emission Characteristics of GaO/GaN Nanotips Using Iodine-assisted Enhanced Focused Ion Beam Etching
Journal: Current Nanoscience
Volume: 7 Issue: 4 Year: 2011 Page: 594-597
Author(s): Zhan-Shuo Hu, Fei-Yi Hung, Shoou-Jinn Chang, Bohr-Ran Huang, Bo-Cheng Lin, Kuan-Jen Chen, Tse-Pu Chen, Wen-I Hsu
An Approach on the Use of Co-sputtered W-DLC Thin Films as Piezoresistive Sensing Materials
Journal: Current Materials Science
Volume: 15 Issue: 1 Year: 2022 Page: 3-9
Author(s): Gabriela Leal,Humber Furlan,Marcos Massi,Mariana Amorim Fraga
Coalescence of Multi-Walled Carbon Nanotubes and their Electronic Conduction Nano-Networks
Journal: Current Nanoscience
Volume: 7 Issue: 5 Year: 2011 Page: 790-793
Author(s): Ishaq Ahmad, Waheed Akram, G. Husnain, Yan Long, Zhou Xingtai
Recent Advances in Biological Tissue Imaging with Time-of-Flight Secondary Ion Mass Spectrometry: Polyatomic Ion Sources, Sample Preparation, and Applications
Journal: Current Pharmaceutical Design
Volume: 13 Issue: 3 Year: 2007 Page: 3335-3343
Author(s): Alain Brunelle, Olivier Laprevote
Growth and Characterization of Chromium Oxynitride Thin Films Prepared Using Reactive Unbalanced Magnetron Sputtering in Presence of Air as Reactive Gas
Ebook: Metallic Oxynitride Thin Films by Reactive Sputtering and Related Deposition Methods: Process, Properties and Applications
Volume: 1 Year: 2013
Author(s): Saïd Agouram,Guy Terwagne,Franz Bodart
Doi: 10.2174/9781608051564113010010
Review on FIB-Induced Damage in Diamond Materials
Journal: Current Nanoscience
Volume: 12 Issue: 6 Year: 2016 Page: 685-695
Author(s): Zhen Tong, Xiangqian Jiang, Xichun Luo, Qingshun Bai, Zongwei Xu, Liam Blunt, Yingchun Liang