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Search Result "Strained silicon"

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Research Article

Electrical Conductivity of Carbon Black - Silicon Rubber Nanocomposites: Effects of Strain, Load and Loading Rate

Journal: Current Nanomaterials
Volume: 1 Issue: 3 Year: 2016 Page: 195-200
Author(s): Satilmis Basan,Erol Sancaktar

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The Process and Mechanism of Low Temperature Silicon Carbide-to-Silicon Direct Bonding Using Amorphous Hydrogenated Silicon Carbide Films

Journal: Micro and Nanosystems
Volume: 2 Issue: 2 Year: 2010 Page: 100-107
Author(s): Jiangang Du, Christian A. Zorman

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Introduction to Strain Metrology for Semiconductors

Ebook: Semiconductor Strain Metrology: Principles and Applications
Volume: 1 Year: 2012
Author(s): Terence K.S. Wong
Doi: 10.2174/978160805359911201010004

Recent Progress and Patents in Silicon Nanotubes

Journal: Recent Patents on Nanotechnology
Volume: 4 Issue: 1 Year: 2010 Page: 10-19
Author(s): Li Z. Pei, Shang B. Wang, Chuan G. Fan

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The Silicon Cell Initiative

Journal: Current Genomics
Volume: 5 Issue: 8 Year: 2004 Page: 687-697
Author(s): Jacky L. Snoep, Hans V. Westerhoff

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Strain, Stress and Semiconductor Properties

Ebook: Semiconductor Strain Metrology: Principles and Applications
Volume: 1 Year: 2012
Author(s): Terence K.S. Wong
Doi: 10.2174/978160805359911201010015

Nanodevices Based on Silicon Nanowires

Journal: Recent Patents on Nanotechnology
Volume: 3 Issue: 1 Year: 2009 Page: 1-9
Author(s): Yuting Wan, Jian Sha, Bo Chen, Yanjun Fang, Zongli Wang, Yewu Wang

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PART 2: OPTICAL STRAIN METROLOGY

Ebook: Semiconductor Strain Metrology: Principles and Applications
Volume: 1 Year: 2012
Author(s): Terence K.S. Wong
Doi: 10.2174/978160805359911201010027

Review Article

A Review on Silicon Nanowires and their use in the Development of NanoPiezoresistive Pressure Sensors

Journal: Nanoscience & Nanotechnology-Asia
Volume: 13 Issue: 5 Year: 2023 Page: 14-22
Author(s): Kirankumar B. Balavalad

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Integrated Silicon Nanophotonic Data Processing Devices: A Brief Review

Journal: Recent Patents on Signal Processing (Discontinued)
Volume: 3 Issue: 1 Year: 2013 Page: 42-48
Author(s): Z. Zalevsky

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