Multifunctional Two- and Three-Dimensional Polycrystalline X-Ray Diffractometry

Residual Stresses/Strains Analysis

Author(s): Cong Qiuzi, Yu Xiang and He Li

Pp: 84-96 (13)

DOI: 10.2174/978160805076511101010084

Abstract

INTRODUCTION

General Considerations

X-ray stress measurement method takes advantage of X-ray diffraction phenomena and is used to obtain the stress in metallic materials, ceramics and polycrystalline aggregates by measuring their lattice distortions. This method has salient features: a) the measurement is non-contact and non-destructive; b) not only the added stress but also the residual stress is measurable; c) exceedingly small portions (approximate 1mm2) in a thin layer (a few μm or less) of the sample are examined. This measurement technique is especially effective, such as....

Related Journals
Related Books
© 2024 Bentham Science Publishers | Privacy Policy