Abstract
IDENTIFICATION OF PHASES
The qualitative identification of phase depends, ultimately, upon the measurement of the precise locations and intensities of the diffraction lines. Interplanar spacings corresponding to the diffracted X-rays are to be found first, and then intensities are measured either by a diffractometer, which can give excellent results, when the Ni- or singlecrystal monochromator is used as the filter.
Principle of Superposition of X-Ray Patterns
It is well-known that X-rays diffracted by incoherent planes are according to the principle of superposition of intensities. The same principle is followed by X-ray patterns produced from different crystalline substances. Considering a system consisting of two phases denoted by capital letters, and let the same notation represent their fingerprints as peaks, then....
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