Search Result "Atomic beam deposition"
Direct Energy Deposition
Ebook: Advances in Additive Manufacturing Processes
Volume: 1 Year: 2021
Author(s): Chandan Pandey,Ashutosh Sharma,Sunkulp Goel,Sanjeev Kumar
Doi: 10.2174/9789815036336121010013
Deposition of Cr Atoms Using Switching-Detuning Light Mask for Direct Atom Lithography
Journal: Current Nanoscience
Volume: 15 Issue: 6 Year: 2019 Page: 626-630
Author(s): Li Zhu,Xiao Deng,Jie Liu,Xinbin Cheng,Tongbao Li
Molecular Beam Epitaxy (MBE)
Ebook: Silicon Based Thin Film Solar Cells
Volume: 1 Year: 2013
Author(s): Lorenzo Morresi
Doi: 10.2174/9781608055180113010008
Electron Beam Melting
Ebook: Advances in Additive Manufacturing Processes
Volume: 1 Year: 2021
Author(s): M. Bhuvanesh Kumar,S. M. Senthil,S. Praveen Kumar
Doi: 10.2174/9789815036336121010010
Focused Ion Beam Methods and its Applications in Secondary Batteries
Ebook: Advanced Characterization Technologies for Secondary Batteries
Volume: 1 Year: 2024
Author(s):
Doi: 10.2174/9789815305425124010005
Growth of III-Arsenide/Phosphide Nanowires by Molecular Beam Epitaxy
Ebook: Advances in III-V Semiconductor Nanowires and Nanodevices
Volume: 1 Year: 2011
Author(s): Jean-Christophe Harmand,Frank Glas,Gilles Patriarche,Ludovic Largeau,Maria Tchernycheva,Corinne Sartel,Linsheng Liu,Fauzia Jabeen
Doi: 10.2174/978160805052911101010068
Structural, Optical, and Electrical Properties of CdTe Thin Films Deposited by Glancing Angle Deposition
Journal: Current Nanoscience
Volume: 8 Issue: 5 Year: 2012 Page: 783-789
Author(s): A. A. El-Amin,A. Ibrahim
Atomic Force Microscopy and its Applications in Secondary Batteries
Ebook: Advanced Characterization Technologies for Secondary Batteries
Volume: 1 Year: 2024
Author(s):
Doi: 10.2174/9789815305425124010006
Heterostructure Growth
Ebook: Physics and Technology of Semiconductor Thin Film-Based Active Elements and Devices
Volume: 1 Year: 2009
Author(s): Halyna Khlyap
Doi: 10.2174/978160805021510901010021
Ultrathin Alumina Films as Nano-Templates for Metals Deposition
Journal: Current Nanoscience
Volume: 5 Issue: 1 Year: 2009 Page: 58-68
Author(s): Qi-Hui Wu