Search Result "Microcracks"

Mechanical Properties of Al2TiO5 Ceramics for High Temperature Application

Journal: Current Nanoscience
Volume: 10 Issue: 1 Year: 2014 Page: 154-158
Author(s): Dami Kim,Hyeong-Jun Kim,Hyung-Tae Kim,Jung Namkung,Ikjin Kim,Sung-Churl Choi,Sung- Soo Ryu

Review Article

A Review on Investigation of PV Solar Panel Surface Defects and MPPTTechniques

Journal: Recent Advances in Electrical & Electronic Engineering
Volume: 15 Issue: 8 Year: 2022 Page: 607-620
Author(s): Gayathri Monicka Subarnan

Nano-Science Revelations in Bone Research

Journal: Current Nanoscience
Volume: 3 Issue: 4 Year: 2007 Page: 345-351
Author(s): Tue Hassenkam, Rene Bruggebusch Svensson, Maksim Zalkovskij

Research Article

Microwave Thermal Treatment for the Recovery of Re in Copper and Molybdenum Concentrates

Journal: Current Microwave Chemistry
Volume: 11 Issue: 2 Year: 2024 Page: 116-124
Author(s):

Structural Features of Nanocrystalline Materials

Ebook: Nanocoatings Nanosystems Nanotechnologies
Volume: 1 Year: 2012
Author(s): Alexander D. Pogrebnjak,Vyacheslav M. Beresnev
Doi: 10.2174/978160805416911201010003

Analysis of Defects in Electroluminescent Images of Solar Panel using Image Processing Algorithms

Ebook: Intelligent Technologies for Research and Engineering
Volume: 2 Year: 2024
Author(s): S. N. Kumar,H. Ajay Kumar
Doi: 10.2174/9789815165586124020010

Self-healing and Regenerative Materials

Ebook: Synthesis of Nanomaterials
Volume: 3 Year: 2023
Author(s):
Doi: 10.2174/9789815136920123030010

Solid-Fueled Rocket Structural Integrity Assessment

Ebook: Structural Failure Analysis and Prediction Methods for Aerospace Vehicles and Structures
Volume: 1 Year: 2010
Author(s): S.Y. Ho
Doi: 10.2174/978160805024611001010156

Cathodoluminescence Method

Ebook: Semiconductor Strain Metrology: Principles and Applications
Volume: 1 Year: 2012
Author(s): Terence K.S. Wong
Doi: 10.2174/978160805359911201010060

Patent Selections

Journal: Recent Patents on Chemical Engineering
Volume: 4 Issue: 1 Year: 2011 Page: 78-78
Author(s): Bentham Science Publishers

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