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Nanoscience & Nanotechnology-Asia

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ISSN (Online): 2210-6820

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Review Article

Microstructure and Defect Study in Thin Film Heterostructure Materials

Author(s): Fan Wu*

Volume 10, Issue 2, 2020

Page: [109 - 116] Pages: 8

DOI: 10.2174/2210681208666181008143408

Price: $65

Abstract

Deformation twins and phase interface are important planar defects and microstructures that greatly influence the overall performance of a material system. In multi-layer thin-film heterostructures, their effect is more manifest due to the small dimension of thin films and their influence on the growth of multi-layer structures. This article reviews the recent progress in microstructure and defects observed in thin film heterostructures, serving as a guideline for future research in this field. The multilayer thin-film heterostructures studied here were grown by pulsed laser deposition technique. Microstructures and defects were investigated by Transmission Electron Microscopy.

Keywords: Microstructure, defects, thin-film heterostructures, pulsed-laser deposition, transmission electron microscopy, nanomaterials synthesis and characterization.

Graphical Abstract

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