High-Resolution Electron Microscopy of Nanostructured Materials

Title: High-Resolution Electron Microscopy of Nanostructured Materials

Volume: 1 Issue: 1

Author(s): Takeo Oku

Affiliation:

Keywords: High-resolution electron microscopy, atomic structure, nanostructured materials, inorganic materials, boron nitride, nano-scale crystals, x-ray diffraction, two-dimensional plane, hexagonal c-axis, Hg0 5Tl0 5Ba2CuO5, RHREM values, Y-hole, non-icosahedral B24, electron diffraction, amorphous carbon

Abstract: High-resolution electron microscopy (HREM) analysis has contributed to the direct analysis of the atomic structures of advanced nanostructured materials, of which properties of these materials are strongly dependent on the atomic arrangements. In the present paper, the direct atomic analysis of nanostructured materials such as borides and oxide materials was described, and the HREM methods were applied to boron nitride nanomaterials such as nanotubes and nanoparticles.

Cite this article as:

Oku Takeo, High-Resolution Electron Microscopy of Nanostructured Materials, Nanoscience & Nanotechnology-Asia 2011; 1 (1) . https://dx.doi.org/10.2174/2210681211101010059