Abstract
Background: The need for high performance, small size, low delay, low power consumption, and long battery backup of portable systems is increasing with the advancement of technology. Many features of portable systems can be improved using scaling methods. In the scaling process, reducing the size of devices causes serious difficulties, including the short channel effect (SCE) and leakage current, which degenerates the characteristics of the systems.
Objectives: In this review paper, a trending carbon nanotube field effect transistor (CNTFET) technology is discussed in detail. CNTFET can replace the conventional metal oxide semiconductor field effect transistor (MOSFET) technology to overcome the SCE problems in the nanoscale regime and also meet the requirements of portable systems.
Methods: The CNTFET is an extremely good nanoscale technology due to its one-dimension band structure, high transconductance, high electron mobility, superior control over channel formation, and better threshold voltage. This technology is used to construct high-performance and low-power circuits by replacing the MOSFET technology. CNTFET in comparison to MOSFET takes the carbon nanotube (CNT) as a channel region.
Results: The value of threshold voltage in CNTFET changes with the diameter of CNT. The threshold voltage of the devices controls many parameters at the circuit-level design. Hence, the detailed operation and the characteristics of CNTFET devices are presented in this review paper. The existing CNTFET-based ternary full adder (TFA) circuits are also described in this review paper for the performance evaluation of different parameters.
Conclusion: CNTFET technology is the possible solution for the SCE in the nanoscale regime and is capable to design efficient logic circuits. The circuits using the CNTFET technology can provide better performance and various advantages, including fast speed, small area, and low power consumption, in comparison to the MOSFET circuits. Thus, CNTFET technology is the best choice for circuit designs at the nanoscale.
Graphical Abstract
[http://dx.doi.org/10.1080/00207217.2014.996786]
[http://dx.doi.org/10.1002/jnm.2730]
[http://dx.doi.org/10.1080/1448837X.2021.1966957]
[http://dx.doi.org/10.1002/j.1538-7305.1959.tb03907.x]
[http://dx.doi.org/10.1007/978-3-319-19758-6_11]
[http://dx.doi.org/10.1142/S0218126616501346]
[http://dx.doi.org/10.1007/s11277-014-1735-x]
[http://dx.doi.org/10.1002/jnm.2907]
[http://dx.doi.org/10.1080/17455030.2022.2043569]
[http://dx.doi.org/10.1007/s10470-020-01765-z]
[http://dx.doi.org/10.1142/S0218126621501176]
[http://dx.doi.org/10.1007/s11277-021-08522-z]
[http://dx.doi.org/10.1002/cta.2886]
[http://dx.doi.org/10.1108/CW-08-2020-0199]
[http://dx.doi.org/10.1016/j.asoc.2016.12.006]
[http://dx.doi.org/10.1109/ICOEI51242.2021.9453046]
[http://dx.doi.org/10.1021/nl025875l]
[http://dx.doi.org/10.1007/978-3-319-41981-7_10]
[http://dx.doi.org/10.1021/nl070133j] [PMID: 17461605]
[http://dx.doi.org/10.1109/LED.2007.901680]
[http://dx.doi.org/10.1108/HFF-02-2022-0097]
[http://dx.doi.org/10.1142/S0218126622500360]
[http://dx.doi.org/10.1016/j.matpr.2015.10.048]
[http://dx.doi.org/10.1016/j.mser.2003.10.001]
[http://dx.doi.org/10.1016/B978-0-323-48221-9.00001-7]
[http://dx.doi.org/10.1109/TED.2008.922855]
[http://dx.doi.org/10.1007/s00604-005-0439-z]
[http://dx.doi.org/10.1021/ja301299t] [PMID: 22571240]
[http://dx.doi.org/10.1016/j.heliyon.2019.e02605] [PMID: 31687491]
[http://dx.doi.org/10.2174/187221010790712084] [PMID: 20180755]
[http://dx.doi.org/10.1016/j.physe.2014.01.020]
[http://dx.doi.org/10.3390/electronics10010079]
[http://dx.doi.org/10.1109/UPCON47278.2019.8980053]
[http://dx.doi.org/10.1007/s00034-013-9672-6]
[http://dx.doi.org/10.1109/DTIS.2006.1708731]
[http://dx.doi.org/10.14810/ijamse.2014.3401]
[http://dx.doi.org/10.3390/s21030995] [PMID: 33540641]
[http://dx.doi.org/10.1039/B614121H] [PMID: 17164886]
[http://dx.doi.org/10.1049/iet-cdt.2013.0023]
[http://dx.doi.org/10.1109/TNANO.2009.2036845]
[http://dx.doi.org/10.1109/TED.2007.909043]
[http://dx.doi.org/10.22232/stj.2016.04.02.06]
[http://dx.doi.org/10.12693/APhysPolA.127.1124]
[http://dx.doi.org/10.1080/00207217.2011.623269]
[http://dx.doi.org/10.1109/TED.2005.859654]
[http://dx.doi.org/10.1049/mnl.2015.0434]
[http://dx.doi.org/10.5815/ijmecs.2014.11.06]
[http://dx.doi.org/10.1109/RDCAPE52977.2021.9633592]
[http://dx.doi.org/10.1088/1674-4926/35/7/075001]
[http://dx.doi.org/10.1007/s10825-015-0714-0]
[http://dx.doi.org/10.1088/0268-1242/29/7/073001]
[http://dx.doi.org/10.1166/nnl.2010.1053]
[http://dx.doi.org/10.1109/MC.2015.376]
[http://dx.doi.org/10.1063/1.2186100]
[http://dx.doi.org/10.1109/LED.2007.914069]
[http://dx.doi.org/10.1021/nl400544q] [PMID: 23638708]
[http://dx.doi.org/10.1149/2162-8777/ac77bc]
[http://dx.doi.org/10.1007/s10825-017-0980-0]
[http://dx.doi.org/10.1021/nl070891+] [PMID: 17604404]
[http://dx.doi.org/10.1016/j.carbon.2011.08.041]
[http://dx.doi.org/10.1109/TC.1984.1676392]
[http://dx.doi.org/10.1109/TC.1968.227407]
[http://dx.doi.org/10.1109/TC.1981.1675860]
[http://dx.doi.org/10.1109/JSSC.1984.1052216]
[http://dx.doi.org/10.1155/1996/94696]
[http://dx.doi.org/10.1049/iet-cds.2016.0443]
[http://dx.doi.org/10.1166/jno.2018.2244]
[http://dx.doi.org/10.1080/03772063.2017.1338973]
[http://dx.doi.org/10.1016/j.compeleceng.2019.05.018]
[http://dx.doi.org/10.1016/j.aeue.2020.153600]
[http://dx.doi.org/10.1007/s00034-020-01638-w]
[http://dx.doi.org/10.1007/s00034-020-01519-2]
[http://dx.doi.org/10.1080/00207217.2021.1908616]