Search Result "tension forces"
10 Years of Tension on Chromatin: Results from Single Molecule Force Spectroscopy
Journal: Current Pharmaceutical Biotechnology
Volume: 10 Issue: 5 Year: 2009 Page: 474-485
Author(s): Fan-Tso Chien, John van Noort
A Bevel Gear Tension Balancing Device for Mining Hoist
Journal: Recent Patents on Mechanical Engineering
Volume: 12 Issue: 4 Year: 2019 Page: 383-388
Author(s): Zhixia Wang,Bijuan Yan,Zigui Li
Tension Monitoring Devices Development for Bolted Joints
Journal: Recent Patents on Mechanical Engineering
Volume: 5 Issue: 1 Year: 2012 Page: 45-54
Author(s): Samir Mekid
Recent Patents on Tension Control Device of Wire Electrode in WEDM
Journal: Recent Patents on Mechanical Engineering
Volume: 12 Issue: 3 Year: 2019 Page: 188-200
Author(s): Baocheng Xie,Xiaowei Ni,Jingang Jiang,Yuan Zhang,Ye Dai,Shengle Ren
96-Well Plate Surface Tension Measurements for Fast Determination of Drug Solubility
Journal: Letters in Drug Design & Discovery
Volume: 5 Issue: 7 Year: 2008 Page: 471-476
Author(s): Tiina Heikkila, Leena Peltonen, Saila Taskinen, Timo Laaksonen, Jouni Hirvonen
Force Denaturation of Proteins - an Unfolding Story
Journal: Current Nanoscience
Volume: 3 Issue: 1 Year: 2007 Page: 3-15
Author(s): David J. Brockwell
Analyzing the Influence of RSW Process Parameters on the Cross Tension Failure Load of Dissimilar functionally graded AISI 304/316L Stainless Steel Sheets
Ebook: Functional Composite Materials: Manufacturing Technology and Experimental Application
Volume: 1 Year: 2022
Author(s):
Doi: 10.2174/9789815039894122010006
Single-molecule Force Microscopy: A Powerful Tool for Studying theMechanical Properties of Cell Membranes
Journal: Current Analytical Chemistry
Volume: 18 Issue: 6 Year: 2022 Page: 664-676
Author(s): Yan Shi,Mingjun Cai,Hongda Wang
Counting and Breaking Individual Biological Bonds: Force Spectroscopy of Tethered Ligand-Receptor Pairs
Journal: Current Nanoscience
Volume: 3 Issue: 1 Year: 2007 Page: 41-48
Author(s): Raymond W. Friddle, Todd A. Sulchek, Huguette Albrecht, Sally J. De Nardo, Aleksandr Noy
Atomic Force Microscopy Digital Image Correlation Method
Ebook: Semiconductor Strain Metrology: Principles and Applications
Volume: 1 Year: 2012
Author(s): Terence K.S. Wong
Doi: 10.2174/978160805359911201010102