Search Result "electronic flux"
Advances in Electrochemistry for Monitoring Cellular Chemical Flux
Journal: Current Medicinal Chemistry
Volume: 26 Issue: 26 Year: 2019 Page: 4984-5002
Author(s): Mark A. Messerli,Anyesha Sarkar
Production and Characterization of Admixture Nano-Flux WeldingPowder from Agro-Waste (Banana Peel)
Journal: Recent Patents on Mechanical Engineering
Volume: 15 Issue: 1 Year: 2022 Page: 93-101
Author(s): Adeniran Sunday Afolalu,Emetere Moses Eterigho,Sunny-Ekhalume Etse
Behavior of Nanocracks on Micro/Nano-Interfacial Structure Under Thermal Flux Conditions
Journal: Current Nanoscience
Volume: 5 Issue: 3 Year: 2009 Page: 335-338
Author(s): Ningbo Liao, Ping Yang, G. Q. Zhang, L. J. Ernst
13C Metabolic Flux Analysis: From the Principle to Recent Applications
Journal: Current Bioinformatics
Volume: 7 Issue: 1 Year: 2012 Page: 77-86
Author(s): Luciana Calheiros Gomes, Manuel Simoes
High Power Electronic Component: Review
Journal: Recent Patents on Engineering
Volume: 2 Issue: 3 Year: 2008 Page: 174-188
Author(s): Ping H. Chen, Shyy W. Chang, Kuei F. Chiang, Ji Li
Corrosion in Electronics
Ebook: Corrosion Science: Modern Trends and Applications
Volume: 1 Year: 2021
Author(s): U. Naresh,N. Suresh Kumar,K. Chandra Babu Naidu,B. Venkata Shiva Reddy,A. Manohar,M. Ajay Kumar,T. Anil Babu
Doi: 10.2174/9789811481833121010005
NAFLD: Diagnostic Algorithms for Regulating Patient Fluxes
Journal: Current Pharmaceutical Design
Volume: 27 Issue: 27 Year: 2021 Page: 3036-3046
Author(s): Giada Pallini,Emmanuel A. Tsochatzis
Boundary Layer Flow and Cattaneo-Christov Heat Flux of a Nonlinear Stretching Sheet with a Suspended CNT
Journal: Nanoscience & Nanotechnology-Asia
Volume: 9 Issue: 4 Year: 2019 Page: 494-503
Author(s): S. Shakunthala,M.M. Nandeppanavar
Dark-Field Electron Holographic Moire Method
Ebook: Semiconductor Strain Metrology: Principles and Applications
Volume: 1 Year: 2012
Author(s): Terence K.S. Wong
Doi: 10.2174/978160805359911201010080
Electron Beam Melting
Ebook: Advances in Additive Manufacturing Processes
Volume: 1 Year: 2021
Author(s): M. Bhuvanesh Kumar,S. M. Senthil,S. Praveen Kumar
Doi: 10.2174/9789815036336121010010