Search Result "equivalent diode circuit"
Molecular Diodes and Applications
Journal: Recent Patents on Nanotechnology
Volume: 1 Issue: 1 Year: 2007 Page: 51-57
Author(s): M. Jagadesh Kumar
Symbolic Analysis Techniques for Fault Diagnosis and Automatic Design of Analog Circuits
Ebook: Design of Analog Circuits through Symbolic Analysis
Volume: 1 Year: 2012
Author(s): Francesco Grasso,Antonio Luchetta,Stefano Manetti,Maria Cristina Piccirilli,Alberto Reatti
Doi: 10.2174/978160805095611201010361
Metal Semiconductor Contacts Schottky Diodes
Ebook: Solid State & Microelectronics Technology
Volume: 1 Year: 2023
Author(s):
Doi: 10.2174/9789815079876123010004
Symbolic Noise Analysis in Analog Circuits
Ebook: Design of Analog Circuits through Symbolic Analysis
Volume: 1 Year: 2012
Author(s): Carlos Sánchez-López
Doi: 10.2174/978160805095611201010265
Noise and Parasites in Mixed Circuits
Ebook: Towards a Modeling Synthesis of Two or Three-Dimensional Circuits Through Substrate Coupling and Interconnections: Noises and Parasites
Volume: 1 Year: 2014
Author(s): Christian Gontrand
Doi: 10.2174/9781608058266114010004
ESD Protection Design With Low-Capacitance Consideration for High-Speed/High-Frequency I/O Interfaces in Integrated Circuits
Journal: Recent Patents on Engineering
Volume: 1 Issue: 2 Year: 2007 Page: 131-145
Author(s): Ming-Dou Ker, Yuan-Wen Hsiao
On Deducing the Clique Potential of Nanoscale Combinational Circuits
Journal: Current Nanoscience
Volume: 9 Issue: 4 Year: 2013 Page: 514-520
Author(s): P. Balasubramanian, K. Prasad
Semiconductor Devices
Ebook: Solid State & Microelectronics Technology
Volume: 1 Year: 2023
Author(s):
Doi: 10.2174/9789815079876123010007
Automatic Nonlinear Behavioral Model Generation Using Symbolic Circuit Analysis
Ebook: Design of Analog Circuits through Symbolic Analysis
Volume: 1 Year: 2012
Author(s): Ralf Sommer,Eckhard Hennig,Gregor Nitsche,Jochen Broz,Peter Schwarz
Doi: 10.2174/978160805095611201010305
Driving Schemes and Design Considerations for AMOLED
Ebook: Frontiers in Electrical Engineering
Volume: 1 Year: 2015
Author(s): Tsz Kin Ho
Doi: 10.2174/9781681081205115010008