Search Result "drain current"
An Accurate Drain Current Model for Symmetric Dual Gate Tunnel FET Using Effective Tunneling Length
Journal: Nanoscience & Nanotechnology-Asia
Volume: 9 Issue: 1 Year: 2019 Page: 85-91
Author(s): Sasmita Sahoo,Sidhartha Dash,Guru P. Mishra
Impact of Drain Underlap Length Variation on the DC and RF Performance of Cylindrical Gate Tunnel FET
Journal: Nanoscience & Nanotechnology-Asia
Volume: 11 Issue: 1 Year: 2021 Page: 97-103
Author(s): Sidhartha Dash,Guru P. Mishra
OTFT with Silk Screen Printed Drain and Source
Journal: Micro and Nanosystems
Volume: 1 Issue: 1 Year: 2009 Page: 46-49
Author(s): I. El Houti El Jazairi, T. Trigaud, J.-P. Moliton
An Analytical Drain Current Model for Dual-material Gate Graded - channel and Dual-oxide Thickness Cylindrical Gate (DMG-GC-DOT) MOSFET
Journal: Nanoscience & Nanotechnology-Asia
Volume: 9 Issue: 2 Year: 2019 Page: 291-297
Author(s): Hind Jaafar,Abdellah Aouaj,Ahmed Bouziane,Benjamin Iñiguez
Source/Drain Stressor Design for Advanced Devices at 7 nm Technology Node
Journal: Nanoscience & Nanotechnology-Asia
Volume: 10 Issue: 4 Year: 2020 Page: 447-456
Author(s): T.P. Dash,S. Dey,S. Das,J. Jena,E. Mahapatra,C.K. Maiti
The Fundamental MOSFET Model
Ebook: Bipolar Transistor and MOSFET Device Models
Volume: 1 Year: 2016
Author(s): Kunihiro Suzuki
Doi: 10.2174/9781681082615116010008
Design and Analyze the Effect of Hetero Material and Dielectric on TFETwith Dual Work Function Engineering
Journal: Nanoscience & Nanotechnology-Asia
Volume: 14 Issue: 1 Year: 2024 Page: 30-39
Author(s):
Surgical Options for Management of Malignant Pleural Mesothelioma in the Current Era
Journal: Current Respiratory Medicine Reviews
Volume: 12 Issue: 4 Year: 2016 Page: 286-293
Author(s): Mahmoud Loubani, Syed S. Qadri, Azar Hussain, Mubarak A. Chaudhry, Jack A. Kastelik
Biasing Scheme for Low-Voltage CMOS Cascode Current Mirrors
Journal: Recent Patents on Electrical & Electronic Engineering
Volume: 6 Issue: 2 Year: 2013 Page: 124-127
Author(s): Abhijith Arakali, Sunil Rafeeque
Impact of Electrode Length on I-V Characteristics to Linearity of TFET With Source Pocket
Ebook: Nanoelectronics Devices: Design, Materials, and Applications (Part I)
Volume: 1 Year: 2023
Author(s):
Doi: 10.2174/9789815136623123010009