Search Result "Parametric semiconductor model"
Black Body Approach: Parametric Version
Ebook: Solutions to Problems of Controlling Long Waves with the Help of Micro-Structure Tools
Volume: 1 Year: 2011
Author(s): Vladimir V. Arabadzhi
Doi: 10.2174/978160805275211101010046
Optimizing IC Design for Manufacturability
Journal: Recent Patents on Electrical Engineering
Volume: 1 Issue: 3 Year: 2008 Page: 209-213
Author(s): Artur Balasinski
Far-infrared Gallium Nitride-based Quantum Cascade Laser
Ebook: Nanoelectronics Devices: Design, Materials, and Applications Part II
Volume: 1 Year: 2023
Author(s):
Doi: 10.2174/9789815179361123010012
An Overview of Fuel Cells and Simulation Models: Review on Solid Oxide Fuel Cells
Journal: Current Physical Chemistry
Volume: 5 Issue: 3 Year: 2015 Page: 223-252
Author(s): Jose G. S. Canchaya, Nelson C. Furtado, Carlton A. Taft
Optimizing IC Design for Manufacturability - 2011 Update
Journal: Recent Patents on Electrical & Electronic Engineering
Volume: 5 Issue: 2 Year: 2012 Page: 134-154
Author(s): Artur Balasinski
Variable Angle Spectroscopic Ellipsometry
Ebook: Semiconductor Strain Metrology: Principles and Applications
Volume: 1 Year: 2012
Author(s): Terence K.S. Wong
Doi: 10.2174/978160805359911201010028
Lanthanide Complexes in FRET Applications
Journal: Current Inorganic Chemistry
Volume: 1 Issue: 1 Year: 2011 Page: 17-35
Author(s): Daniel Geiβler, Niko Hildebrandt
Parametric Analysis of Indium Gallium Arsenide Wafer-based Thin Body(5 nm) Double-gate MOSFETs for Hybrid RF Applications
Journal: Recent Patents on Nanotechnology
Volume: 18 Issue: 3 Year: 2024 Page: 335-349
Author(s): Viranjay. M. Srivastava
Application of a Continuum Mean Field Approximation to Fullerenes in Lipid Bilayers
Journal: Current Nanoscience
Volume: 7 Issue: 5 Year: 2011 Page: 667-673
Author(s): R. J.K. Udayana Ranatunga, Steven O. Nielsen
Taking a Systems Approach to the Identification of Novel Therapeutic Targets and Biomarkers
Journal: Current Pharmaceutical Biotechnology
Volume: 11 Issue: 7 Year: 2010 Page: 721-734
Author(s): David A. Dunn, Donald Apanovitch, Max Follettie, Tao He, Terence Ryan