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ISSN (Print): 2666-2558
ISSN (Online): 2666-2566

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Research Article

SEGIN-Minus: A New Approach to Design Reliable and Fault-Tolerant MIN

Author(s): Shilpa Gupta* and Gobind Lal Pahuja

Volume 13, Issue 3, 2020

Page: [370 - 380] Pages: 11

DOI: 10.2174/2213275912666181207153651

Price: $65

Abstract

Background: VLSI technology advancements have resulted the requirements of high computational power, which can be achieved by implementing multiple processors in parallel. These multiple processors have to communicate with their memory modules by using Interconnection Networks (IN). Multistage Interconnection Networks (MIN) are used as IN, as they provide efficient computing with low cost.

Objective: the objective of the study is to introduce new reliable MIN named as a (Shuffle Exchange Gamma Interconnection Network Minus) SEGIN-Minus, which provide reliability and faulttolerance with less number of stages.

Methods: MUX at input terminal and DEMUX at output terminal of SEGIN has been employed with reduction in one intermidiate stage. Fault tolerance has been introduced in the form of disjoint paths formed between each source-destnation node pair. Hence reliability has been improved.

Results: Terminal, Broadcast and Network Reliability has been evaluated by using Reliability Block Diagrams for each source-destination node pair. The results have been shown, which depicts the hiher reliability values for newly proposed network. The cost analysis shows that new SEGINMinus is a cheaper network than SEGIN.

Conclusion: SEGIN-Minus has better reliability and Fault-tolerance than priviously proposed SEGIN.

Keywords: Multistage Interconnection Network (MIN), Shuffle Exchange Gamma Interconnection Network (SEGIN), Shuffle Exchange Gamma Interconnection Network Minus (SEGIN-Minus), Reliability, Fault tolerance, Cost.

Graphical Abstract

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