Residual Life Prediction of RF Oscillator Under Accelerated Stress Failure Condition

Title:Residual Life Prediction of RF Oscillator Under Accelerated Stress Failure Condition

Volume: 11 Issue: 3

Author(s): Yiwen Long*, Zhen Liu, Chenglin Yang, Xiuyun Zhou and Qianyang Duan

Affiliation:

• School of Automation Engineering, University of Electronic Science and Technology of China, Chengdu,China

Keywords: RUL, acceleration sensitivity, RF oscillator, M-OPELM, accelerated stress failure, phase noise.

Abstract: Background: Crystal oscillator plays a major role in the RF system as the frequency source while often encountered in vibration condition. In order to maintain the normal operation of the system, implementing estimation and prediction is necessary as a strategy based on performance degradation. However, there is little research addressing the issues associated with health status evaluation and Residual Useful Life (RUL) prediction of the RF crystal oscillator.

Methods: This paper proposes a method to assess the health status and the RUL tested in a case study under vibration condition.

Conclusion: Our approach utilizes acceleration sensitivity(AS) as indicator and the M-estimation based optimally-pruned extreme learning machine (M-OPELM) as technology, obtaining ideal predicting results according to the actual RUL.

Cite this article as:

Long Yiwen *, Liu Zhen , Yang Chenglin , Zhou Xiuyun and Duan Qianyang , Residual Life Prediction of RF Oscillator Under Accelerated Stress Failure Condition, Recent Advances in Electrical & Electronic Engineering 2018; 11 (3) . https://dx.doi.org/10.2174/2352096511666180214122906

DOI https://dx.doi.org/10.2174/2352096511666180214122906	Print ISSN 2352-0965
Publisher Name Bentham Science Publisher	Online ISSN 2352-0973