Double-Layer Dielectric Microdisk Resonator Based Refractive Index Sensing Characteristics

Title:Double-Layer Dielectric Microdisk Resonator Based Refractive Index Sensing Characteristics

Volume: 9 Issue: 1

Author(s): Ma Tao, Liu Heng, Yuan Jin-hui*, Wu Qiang, Gao Jin-hui, Wang Fang, Wang Xu, Yu Chong-xiu and Gerald Farrell

Affiliation:

• State Key Laboratory of Information Photonics and Optical Communications, Beijing University of Posts and Telecommunications, Beijing 100876,China

Keywords: Optical sensors, silicon on insulator technology, optical waveguides, whispering gallery modes, temperature measurement, WGM based resonator.

Abstract: Aims: A double-layer dielectric microdisk resonator is proposed. Its refractive index (RI), sensing characteristics, temperature, compensation are studied.

Method: By using 3D-finite element method (3D-FEM), the modes and transmission response of the double-layer dielectric microdisk resonator are investigated.

Observations: According to the transmission response, there is a critical coupling status when the coupling gap is ~50 nm. With the increasing of the thickness ratio of the polydimethylsiloxane (PDMS) to that of the Si layers, the waveguide sensitivity of RI and temperature decrease sharply, and then changes slowly when the thickness ratio is more than 0.5.

Result: The RI sensitivity and detection limit (DL) are ~25 nm/RIU and ~1.1×10-3 RIU, respectively.

Conclusion: Compared to traditional microdisk resonator, the double-layer dielectric microdisk resonator achieves temperature compensation due to the upper PDMS layer.

Cite this article as:

Tao Ma, Heng Liu, Jin-hui Yuan*, Qiang Wu, Jin-hui Gao, Fang Wang, Xu Wang, Chong-xiu Yu and Farrell Gerald, Double-Layer Dielectric Microdisk Resonator Based Refractive Index Sensing Characteristics, Micro and Nanosystems 2017; 9 (1) . https://dx.doi.org/10.2174/1876402909666170724163927